 | | Solutions | | | | | | |  | Semiconductor | | | In line process control for yield management AFM. Deep trenches.Critical Dimension measurements. | | |
| | | | Biotec/ Lifescience | | | Tapping/Contact AFM in liquids. Hydrophobic, reduced sample inter- action. Unsurpassed nanometer resolution. | | |
| | | | | | Industry | | | Superb tip lifetime for high throughput and reliability. High re- solution. Lower tip spendings. | | |
| | | | Research | | | New tip geometries for new applications. Various Coatings. Nanoindenting. Nanolithography. | | |
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| |  | |  | |  | |  | | | Images by JPK Images, Veeco and Nanotools. |
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| phone. +49 (0)89 1211380
email. contact@nano-tools.com | | | | | | nanotools Solutions | | | | nanotools Scanning Probes are used in Basic Research and Industrial R&D as well as in Production, Quality Control and Yield Management.
The Analyses performed cover the fields of Microsystems, Semiconductors, Chemistry, Material Science, Biology, Medicine and Nanotechnology in general.
The unique material properties in combination with a very flexible geometry, applicable to almost all scanning systems, make existing applications more reliable and more cost efficient. This expands AFM towards samples not accessible for Scanning Probes so far, thus making way for new applications.
We have the solution when it comes to tip issues for whatever application you have in mind. |
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